Effect of annealing temperature on the optical constants of zinc oxide films

被引:39
作者
Bole, M. P. [1 ]
Patil, D. S. [1 ]
机构
[1] N Maharashtra Univ, Dept Elect, Jalgaon, Maharashtra, India
关键词
Optical materials; Sol-gel growth; X-ray diffraction; Optical properties; ZNO THIN-FILMS; CONFINEMENT; DEPOSITION;
D O I
10.1016/j.jpcs.2008.12.001
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
In this paper, the effect of annealing temperature on optical constants was studied. The ZnO films were deposited on microscopic glass substrates using the sol-gel method for various annealing temperatures. The deposited zinc oxide (ZnO) films were characterized by an X-ray diffractometer (XRD), a spectrophotometer and scanning electron microscopy (SEM). The transmittance spectra recorded through the spectrophotometer exhibits 90% transmittance. The XRD spectra showed polycrystalline nature of ZnO film. Optical constants were determined through transmittance spectra using an envelope method. It was found that there was a significant effect of annealing temperature on the refractive index and extinction coefficient of deposited ZnO films. In this experiment, the optimum refractive index value of 1.97 was obtained at 350 degrees C annealing temperature at visible (vis) wavelength. The optical energy gap was found to be of similar to 3.2 eV for all the samples. The top view of SEM showed the ZnO grain growth on the glass substrates. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:466 / 471
页数:6
相关论文
共 23 条
[1]   Single crystalline α-axis ZnO thin films deposited by sol-gel method for optoelectronic devices [J].
Bhole, M. P. ;
Patil, D. S. .
MODERN PHYSICS LETTERS B, 2008, 22 (09) :685-692
[2]  
BHOLE MP, 2007, ADV MAT RAPID COMMUN, V1, P672
[3]   Influence of annealing temperature on the formation and characteristics of sol-gel prepared ZnO films [J].
Castanedo-Pérez, R ;
Jiménez-Sandoval, O ;
Jiménez-Sandoval, S ;
Márquez-Marín, J ;
Mendoza-Galván, A ;
Torres-Delgado, G ;
Maldonado-Alvarez, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1999, 17 (04) :1811-1816
[4]  
COLIA G, 2001, APPL PHYS LETT, V78, P2881
[5]   Oxygen bombardment effects on average crystallite size of sputter-deposited ZnO films [J].
Furuta, Mamoru ;
Hiramatsu, Takahiro ;
Matsuda, Tokiyoshi ;
Li, Chaoyang ;
Furuta, Hiroshi ;
Hirao, Takashi .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2008, 354 (17) :1926-1931
[6]  
Gümüs C, 2006, J OPTOELECTRON ADV M, V8, P299
[7]   Microstructure study of ZnO thin films on Si substrate grown by MOCVD [J].
Huang, Jingyun ;
Ye, Zhizhen ;
Lu, Huanming ;
Wang, Lei ;
Zhao, Binghui ;
Li, Xianhang .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 40 (16) :4882-4886
[8]  
Ilican S, 2007, MATER SCI-POLAND, V25, P709
[9]   Influence of pyrolysis temperature on the properties of sol-gel derived zinc oxide films [J].
Kang, Bo-An ;
Hwang, Kyu-Seog ;
Jeong, Ju-Hyun .
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 2007, 43 (02) :145-149
[10]  
Kato H, 2003, JPN J APPL PHYS 1, V42, P2241, DOI [10.1143/JJAP.42.2241, 10.1143/JJAP.42.224]