Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications

The performance of several designs of dielectric resonators used for microwave characterization of HTS films has been analyzed from the point of view of accuracy, sensitivity, and range. Designs discussed include Hakki-Coleman shielded types as well as open-ended resonators with sapphire, rutile and (ZrSn)TiO3 dielectrics. The best dielectric resonators have proved to have an uncertainty in surface resistance measurements only twice the uncertainty in the Q-factor, high sensitivity, and ability to measure a wide range of surface resistances. Hence the dielectric resonator technique can be considered as a standard for measurements of surface resistance of HTS films for wireless and PCS communication systems applications provided that adequate measurement procedures of the Q(0)-factor are followed.