Reducing EMC problems through an electrical/optical interconnection technology

被引:36
作者
Griese, E [1 ]
机构
[1] Siemens AG, R&D Inst, C Lab, D-33094 Paderborn, Germany
[2] Univ Gesamthsch Paderborn, D-33094 Paderborn, Germany
关键词
electrical/optical interconnection technology; ray tracing; transient simulation of multimode waveguides;
D O I
10.1109/15.809854
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel interconnection technology for printed circuit boards (PCB's) is proposed that has the potential to meet the high-performance requirements of future electronic equipment while at the same time, the electromagnetic compatibility (EMC) behavior will. be improved significantly. The technology has a far-reaching compatibility with the existing printed circuit-board technology and the existing design and manufacturing processes of the electrical part do not need significant modifications. After a short description of the most important basic technologies for its realization, this paper focuses on a general approach for modeling the resulting hybrid electrical/optical interconnections containing integrated optical highly multimodal waveguides with manufacturing-caused rough surfaces. Especially the transient analysis is addressed in order to provide an efficient analysis methodology and algorithms for timing and signal integrity prediction necessary for designing and manufacturing high-speed electronic systems. The developed overall modeling strategy is explained and first available results are presented.
引用
收藏
页码:502 / 509
页数:8
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