Microstructure-dependent magnetoresistance in La1-xMnO3 thin films

被引:13
作者
Fröhlich, K
Vávra, I
Gömöry, F
Souc, J
Bydzovsky, J
Kovác, P
Dobrovodsky, J
Marysko, M
机构
[1] Slovak Acad Sci, Inst Elect Engn, SK-84239 Bratislava, Slovakia
[2] Slovak Univ Technol Bratislava, Fac Elect Engn & Informat Engn, Dept Nucl Phys & Technol, Bratislava 81219, Slovakia
[3] Acad Sci Czech Republic, Inst Phys, Prague 16253 6, Czech Republic
[4] Slovak Univ Technol Bratislava, Fac Elect Engn & Informat Technol, Dept Electromagnet Theory, Bratislava 81219, Slovakia
关键词
colossal magnetoresistance; giant magnetoresistance; epitaxial films; polycrystalline films;
D O I
10.1016/S0304-8853(99)00715-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have prepared thin La1-xMnO3 films by metal organic chemical vapour deposition. The films were grown at deposition temperature T-D = 700 degrees C on various types of substrates; polycrystalline Al2O3, polycrystalline SrTiO3 having various grain size, and single-crystalline SrTiO3 slices. The films exhibited transition to metallic state at temperatures from 200 to 260 K, depending on the substrate. Resistivity at the transition ranged from the value of 10 Ohm cm for the small grain size polycrystalline films to 100 and 300 m Ohm cm for the large grain size polycrystalline and epitaxial film on the SrTiO3 single-crystalline substrate, respectively. We discuss magnetoresistance in the La1-xMnO3 films in correlation with their microstructure, studied by transmission electron microscopy. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:67 / 72
页数:6
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