Study of the surface adhesion of pressure-sensitive adhesives by atomic force microscopy and spherical indenter tests

被引:47
作者
Paiva, A
Sheller, N
Foster, MD [1 ]
Crosby, AJ
Shull, KR
机构
[1] Univ Akron, Maurice Morton Inst Polymer Sci, Akron, OH 44325 USA
[2] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
关键词
D O I
10.1021/ma990765v
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Atomic force microscopy allows observation of the adhesive surface and characterization of the adhesive behavior on a nanoscale level, providing new and important information about the behavior of pressure-sensitive adhesives (PSAs). In this research PSAs consisting of poly(ethylene propylene) and the n-butyl ester of abietic acid are studied. Results of nanoindentation measurements indicate two different types of behavior: a viscoelastic behavior in the tackifier-rich domains and a more highly dissipative response in the matrix with a gradual transition behavior in areas close to the interfaces between the domains and the matrix. The adhesive energy appears to be dictated predominantly by the tackifier-rich domains.
引用
收藏
页码:1878 / 1881
页数:4
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