Position of the Fermi level on an indium arsenide surface treated in sulfur vapor

被引:12
作者
Bezryadin, NN [1 ]
Tatokhin, EA
Budanov, AV
Linnik, AV
Arsent'ev, IN
机构
[1] Voronezh State Technol Acad, Voronezh 394017, Russia
[2] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
关键词
D O I
10.1134/1.1187912
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The characteristic features of the formation kinetics of In2S3 layers on indium arsenide substrates by heterovalent substitution are studied. The activation energies of two steps in this process are separated and determined. The variation of the position of the Fermi level on an InAs surface during treatment in sulfur vapor is recorded by measuring the thermodynamic work function using the Kelvin probe method. (C) 1999 American Institute of Physics. [S1063-7826(99)01012-1].
引用
收藏
页码:1301 / 1303
页数:3
相关论文
共 14 条
[1]  
Abrikosov N. Kh., 1975, SEMICONDUCTOR CHALCO
[2]   OXIDATION OF CLEAVED INAS(110) SURFACES AT ROOM-TEMPERATURE - SURFACE BAND-BENDING AND IONIZATION-ENERGY [J].
BAIER, HU ;
KOENDERS, L ;
MONCH, W .
SOLID STATE COMMUNICATIONS, 1986, 58 (05) :327-331
[3]  
BARRET P, 1976, CINETIQUE HETEROGENE
[4]   Chalcogenide passivation of III-V semiconductor surfaces [J].
Bessolov, VN ;
Lebedev, MV .
SEMICONDUCTORS, 1998, 32 (11) :1141-1156
[5]  
GUTUSOV IY, 1994, ELEKT PROM, P111
[6]  
Lashkarev V.E., 1952, IZV AN SSSR FIZ, V16, P203
[7]  
ORMONT BF, 1973, INTRO PHYSICAL CHEM
[8]   FUNDAMENTAL-STUDIES OF III-V SURFACES AND THE (III-V)-OXIDE INTERFACE [J].
SPICER, WE ;
LINDAU, I ;
PIANETTA, P ;
CHYE, PW ;
GARNER, CM .
THIN SOLID FILMS, 1979, 56 (1-2) :1-18
[9]  
Sysoev B. I., 1990, MIKROELEKTRONIKA, V19, P591
[10]  
SYSOEV BI, 1995, SEMICONDUCTORS+, V29, P12