共 17 条
- [3] Goodwin JF., 1965, CHEM TECHN SYUMP, V315, P20
- [4] Govindaraju K., 1994, GEOSTANDARDS NEWSLET, VXVIII
- [5] GUNTHER D, 1995, CAN J APPL SPECTROSC, V40, P111
- [6] Ultra-trace element analysis of NIST SRM 616 and 614 using laser ablation microprobe inductively coupled plasma mass spectrometry (LAM-ICP-MS): a comparison with secondary ion mass spectrometry (SIMS) [J]. GEOSTANDARDS NEWSLETTER-THE JOURNAL OF GEOSTANDARDS AND GEOANALYSIS, 1997, 21 (02): : 191 - 203
- [7] HORN I, 1995, THESIS G AUGUST U GO
- [8] HORN I, 1999, IN PRESS CHEM GEOLOG
- [9] JACKSON SE, 1992, CAN MINERAL, V30, P1049
- [10] TRACE-ELEMENT ANALYSIS OF GEOLOGICAL SURVEY OF JAPAN SILICATE REFERENCE MATERIALS - COMPARISON OF SSMS WITH ICP-MS DATA AND A CRITICAL DISCUSSION OF COMPILED VALUES [J]. FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1994, 350 (4-5): : 310 - 318