X-ray spectromicroscopy of polymer/fullerene composites: Quantitative chemical mapping

被引:53
作者
McNeill, Christopher R.
Watts, Benjamin
Thomsen, Lars
Belcher, Warwick J.
Kilcoyne, A. L. David
Greenham, Neil C.
Dastoor, Paul C.
机构
[1] Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England
[2] Univ Newcastle, Sch Math & Phys Sci, Callaghan, NSW 2308, Australia
[3] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
[4] Univ Calif Berkeley, Lawrence Berkeley Lab, ALS, Berkeley, CA 94720 USA
关键词
fullerenes; phase morphology; polymer blends; solar cells; X-ray microscopy;
D O I
10.1002/smll.200600300
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Scanning transmission X-ray microscopy (STXM) was used to provide the first quantitative nanoscale chemical maps of a conjugated polymer/methanofullerene blend. STXM technique utilized a variable energy X-ray beam with a spot size of 50 nm or smaller to probe the bulk chemical composition of thin films. Chemical contrast was obtained from differences in the near-edge X-ray absorption fine structure (NEXAFS) carbon K-edge spectra. The chemical composition was also determined along a line profile by taking a full NEXAFS spectrum at a succession of points, which was then fitted with a weighted sum of pristine spectra. It was observed that (6,6)-phenyl-C61-butyric acid (PCBM) domain plays an important role in device performance by determining whether or not photoabsorption by the PCBM is able to contribute to the overall photocurrent. Short-circuit photocurrent spectra revealed an enhanced contribution by PCBM in chlorobenzene devices.
引用
收藏
页码:1432 / 1435
页数:4
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