Coupled Ionic and Electronic Transport Model of Thin-Film Semiconductor Memristive Behavior

被引:202
作者
Strukov, Dmitri B. [1 ]
Borghetti, Julien L. [1 ]
Williams, R. Stanley [1 ]
机构
[1] Hewlett Packard Labs, Palo Alto, CA 94304 USA
关键词
ion transport; memristive behavior; modeling; resistive switching; thin films; VOLTAGE CHARACTERISTICS; EQUATIONS; CONDUCTORS; NANOIONICS; SYSTEMS; DEVICES;
D O I
10.1002/smll.200801323
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The memristor, the fourth passive circuit element, was predicted theoretically nearly 40 years ago, but we just recently demonstrated both. an intentional material system and an analytical model that exhibited the properties of such a device. Here we provide a more physical model based on numerical solutions of coupled drift-diffusion equations for electrons and ions with appropriate boundary conditions. We simulate the dynamics of a two-terminal memristive device based on a semiconductor thin film with mobile dopants that are partially compensated by a small amount of immobile acceptors. We examine the mobile ion distributions, zero-bias potentials, and current-voltage characteristics of the model for both steady-state bias conditions and for dynamical switching to obtain physical insight into the transport processes responsible for memristive behavior in semiconductor films.
引用
收藏
页码:1058 / 1063
页数:6
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