Overlayer test of surface photoemission effect in Cu(100)

被引：36

作者：

Hansen, ED ^{[1
]}

Miller, T ^{[1
]}

Chiang, TC ^{[1
]}

机构：

[1] UNIV ILLINOIS,SEITZ MAT RES LAB,URBANA,IL 61801

来源：

PHYSICAL REVIEW LETTERS | 1997年 / 78卷 / 14期

关键词：

D O I：

10.1103/PhysRevLett.78.2807

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Angle-resolved photoemission from bulk valence bands of a single crystal yields direct-transition peaks that are often distorted due to interference with broadband indirect emission induced by the surface. The present study is a direct test of this surface effect by using an overlayer to modify the surface boundary condition. A Cu(100) single crystal exhibited a rather asymmetric sp direct-transition peak and a significant indirect emission intensity. Deposition of a thin Ag overlayer shielded the Cu surface from vacuum, and both the peak asymmetry and the indirect emission intensity were suppressed.

引用

页码：2807 / 2810

页数：4

共 9 条

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