共 25 条
[3]
BENNINGHOVEN A, 1987, SECONDARY ION MASS S, P277
[4]
BENNISON SJ, 1983, J AM CERAM SOC, V66, pC90, DOI 10.1111/j.1151-2916.1983.tb10065.x
[6]
BENNISON SJ, 1995, Patent No. 5411583
[7]
Brydson R, 1998, J AM CERAM SOC, V81, P369, DOI 10.1111/j.1151-2916.1998.tb02343.x
[8]
HIGH-RESOLUTION CHEMICAL IMAGING WITH SCANNING ION PROBE SIMS
[J].
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES,
1995, 143
:191-212
[9]
CHABALA JM, 1997, P MICR MICR 97 M CLE, P525
[10]
Coble R. L., 1962, US Patent, Patent No. 026210