Formation and growth of black spots in organic light-emitting diodes

被引：288

作者：

McElvain, J ^{[1
]}

Antoniadis, H ^{[1
]}

Hueschen, MR ^{[1
]}

Miller, JN ^{[1
]}

Roitman, DM ^{[1
]}

Sheats, JR ^{[1
]}

Moon, RL ^{[1
]}

机构：

[1] HEWLETT PACKARD LABS, PALO ALTO, CA 94304 USA

来源：

JOURNAL OF APPLIED PHYSICS | 1996年 / 80卷 / 10期

关键词：

D O I：

10.1063/1.363598

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report electroluminescence (EL) degradation studies of thin-film organic light-emitting diodes under ambient conditions. Bilayer organic ITO/TPD/Alq(3)/Mg/Ag devices were studied via EL and photoluminescence (PL) microscopy. In situ imaging of device luminescing areas and measurement of sample luminance were performed, allowing for a detailed study of black spot formation and luminance reduction under constant voltage stress conditions. Post-stress devices were further characterized using PL microscopy, and it was found that black spots result from delamination of the metal at the Alq(3)/Mg interface initiated by pinholes on the cathode, caused by substrate defects. (C) 1996 American Institute of Physics.

引用

页码：6002 / 6007

页数：6

共 20 条

[1] ELECTROLUMINESCENCE IN ORGANIC FILMS WITH 3-LAYER STRUCTURE
ADACHI, C
TOKITO, S
TSUTSUI, T
SAITO, S
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (02): : L269 - L271
[2] RELIABILITY AND DEGRADATION OF ORGANIC LIGHT-EMITTING DEVICES
BURROWS, PE
BULOVIC, V
FORREST, SR
SAPOCHAK, LS
MCCARTY, DM
THOMPSON, ME
[J]. APPLIED PHYSICS LETTERS, 1994, 65 (23) : 2922 - 2924
[3] OBSERVATION OF DEGRADATION PROCESSES OF AL ELECTRODES IN ORGANIC ELECTROLUMINESCENCE DEVICES BY ELECTROLUMINESCENCE MICROSCOPY, ATOMIC FARCE MICROSCOPY, SCANNING ELECTRON-MICROSCOPY, AND ANGER ELECTRON-SPECTROSCOPY
DO, LM
HAN, EM
NIIDOME, Y
FUJIHIRA, M
KANNO, T
YOSHIDA, S
MAEDA, A
IKUSHIMA, AJ
[J]. JOURNAL OF APPLIED PHYSICS, 1994, 76 (09) : 5118 - 5121
[4] COLOR VARIATION WITH ELECTROLUMINESCENT ORGANIC SEMICONDUCTORS IN MULTIMODE RESONANT CAVITIES
DODABALAPUR, A
ROTHBERG, LJ
MILLER, TM
[J]. APPLIED PHYSICS LETTERS, 1994, 65 (18) : 2308 - 2310
[5] Growth of dark spots by interdiffusion across organic layers in organic electroluminescent devices
Fujihira, M
Do, LM
Koike, A
Han, EM
[J]. APPLIED PHYSICS LETTERS, 1996, 68 (13) : 1787 - 1789
[6] INFLUENCE OF THE EMISSION SITE ON THE RUNNING DURABILITY OF ORGANIC ELECTROLUMINESCENT DEVICES
HAMADA, Y
SANO, T
SHIBATA, K
KUROKI, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (7A): : L824 - L826
[7] Highly efficient blue electroluminescence from a distyrylarylene emitting layer with a new dopant
Hosokawa, C
Higashi, H
Nakamura, H
Kusumoto, T
[J]. APPLIED PHYSICS LETTERS, 1995, 67 (26) : 3853 - 3855
[8] MULTILAYER WHITE LIGHT-EMITTING ORGANIC ELECTROLUMINESCENT DEVICE
KIDO, J
KIMURA, M
NAGAI, K
[J]. SCIENCE, 1995, 267 (5202) : 1332 - 1334
[9] ORGANIC ELECTROLUMINESCENT DEVICES USING A MIXED SINGLE-LAYER
NAKA, S
SHINNO, K
OKADA, H
ONNAGAWA, H
MIYASHITA, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1994, 33 (12B): : L1772 - L1774
[10] A chemical failure mechanism for aluminum(III) 8-hydroxyquinoline light-emitting devices
Papadimitrakopoulos, F
Zhang, XM
Thomsen, DL
Higginson, KA
[J]. CHEMISTRY OF MATERIALS, 1996, 8 (07) : 1363 - &

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