Defects in tungsten responsible for molecular hydrogen isotope retention after exposure to low energy plasmas

被引:32
作者
Causey, R. A. [1 ]
Doerner, R. [2 ]
Fraser, H. [3 ]
Kolasinski, R. D. [1 ]
Smugeresky, J. [1 ]
Umstadter, K. [2 ]
Williams, R. [3 ]
机构
[1] Sandia Natl Labs, Livermore, CA 94550 USA
[2] Univ Calif San Diego, San Diego, CA 92103 USA
[3] Ohio State Univ, Columbus, OH 43210 USA
关键词
BLISTER FORMATION; DEUTERIUM RETENTION; THERMAL-DESORPTION; FACING MATERIALS; FLUX; SURFACE; DAMAGE; VOIDS;
D O I
10.1016/j.jnucmat.2009.01.300
中图分类号
T [工业技术];
学科分类号
120111 [工业工程];
摘要
Recent work on hydrogen isotope retention in tungsten has shown a substantial fraction of the retained hydrogen to be in the form of molecules. It can be expected that hydrogen permeating through a material such as tungsten, that has a very low solubility for hydrogen, would come out of solution and combine into molecules at voids located throughout the bulk. The purpose of this report is to determine the type of voids responsible for the molecular retention. High purity tungsten provided by Plansee Aktiengesellschaft was first polished, annealed at 1273 K in vacuum for one hour, and then exposed to high fluxes and high fluences of deuterium in the PISCES facility. High resolution Transmission Electron Microscopy was then used to examine the samples for voids. The results of these experiments were used to interpret the expected behavior of tungsten to be used as the divertor of the ITER fusion device. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:717 / 720
页数:4
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