Simultaneous EUV and X-ray variability of NGC 4051

被引:22
作者
Uttley, P [1 ]
MHardy, IM
Papadakis, IE
Cagnoni, I
Fruscione, A
机构
[1] Univ Southampton, Dept Phys & Astron, Southampton SO17 1BJ, Hants, England
[2] Univ Crete, Dept Phys, Iraklion 71003, Crete, Greece
[3] SISSA, ISAS, I-34014 Trieste, Italy
[4] Harvard Smithsonian Ctr Astrophys, Cambridge, MA 02138 USA
关键词
galaxies : active; galaxies : individual : NGC 4051; galaxies : Seyfert; X-rays : galaxies;
D O I
10.1046/j.1365-8711.2000.03266.x
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We present a flux variability study of simultaneous RXTE and EUVE observations of the highly variable Seyfert galaxy NGC 4051. We find a strong correlation between variability in the EUV and medium-energy X-ray bands, indicating that both are sampling the same power-law continuum. The lag between the two bands is less than 20 ks and, depending on model assumptions, may be < 1 ks. We examine the consequences of such a small lag in the context of simple Comptonization models for the production of the power-law continuum. A lag of < 1 ks implies that the size of the Comptonizing region is less than 20 Schwarzschild radii for a black hole of mass > 10(6) M..
引用
收藏
页码:880 / 886
页数:7
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