Near-edge absorption fine structure and UV photoemission spectroscopy studies of aligned single-walled carbon nanotubes on Si(100) substrates

被引：19

作者：

Fleming, L ^{[1
]}

Ulrich, MD

Efimenko, K

Genzer, J

Chan, ASY

Madey, TE

Oh, SJ

Zhou, O

Rowe, JE

机构：

[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

[2] USA, Res Off, Div Phys, Res Triangle Pk, NC 27709 USA

[3] N Carolina State Univ, Dept Chem Engn, Raleigh, NC 27695 USA

[4] Rutgers State Univ, Dept Phys & Astron, Piscataway, NJ 08855 USA

[5] Rutgers State Univ, Surface Modificat Lab, Piscataway, NJ 08855 USA

[6] Univ N Carolina, Curriculum Appl & Mat Sci, Chapel Hill, NC 27599 USA

[7] Univ N Carolina, Dept Phys & Astron, Chapel Hill, NC 27599 USA

[8] Univ N Carolina, Dept Chem, Chapel Hill, NC 27599 USA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2004年 / 22卷 / 04期

关键词：

D O I：

10.1116/1.1775190

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report near-edge absorption fine structure (NEXAFS) and UV photoemission spectroscopy (UPS) studies of aligned single-walled carbon nanotube films on Si(100) substrates. Orientation of the films was detected in the NEXAFS spectra, with the intensity of the pi* core exciton at 284.4 eV showing a strong dependence on nanotube alignment with respect to the polarization of the incident radiation. At lower angles of incidence, the intensity of the pi* peak was higher for all orientations, which we attribute to the greater accessibility of the pi* orbitals. UPS spectra of the films showed little angular dependence and included features consistent with the total density of states of graphite. As a result of the nanotube curvature and the distribution-of nanotube chiralities, the UPS spectra are similar to angle-integrated graphite spectra. (C) 2004 American Vacuum Society.

引用

页码：2000 / 2004

页数：5

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