Study of quasicrystalline thin films based on Al-Pd-Mn and Al-Cu-Fe prepared by PLD

被引:7
作者
Sonsky, J [1 ]
Jelinek, M [1 ]
Jastrabik, L [1 ]
Studnicka, V [1 ]
Chvostova, D [1 ]
Bryknar, Z [1 ]
机构
[1] CZECH TECH UNIV,FAC NUCL SCI & PHYS ENGN,DEPT SOLID STATE ENGN,CR-11519 PRAGUE 8,CZECH REPUBLIC
关键词
D O I
10.1023/A:1021133222963
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Thin films of Al-70 Pd-20 Mn-10 Al-63 Cu-25 Fe-12 Al-70 Pd-20 Mn-10 and Al-63 Cu-25 Fe-12 were grown by laser ablation on fused silica at set of deposition temperature -196 degrees C, room temperature 165 degrees C and 350 degrees C. Structure, morphology, resistivity and refractive index of prepared layers were studied.
引用
收藏
页码:1019 / 1024
页数:6
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