Powder neutron diffraction of La-apatite under low temperature

被引:22
作者
Matsushita, Yoshitaka [1 ]
Izumi, Fujio [1 ]
Kobayashi, Kiyoshi [1 ]
Igawa, Naoki [2 ]
Kitazawa, Hideaki [1 ]
Oyama, Yukiko [3 ]
Miyoshi, Shogo [3 ]
Yamaguchi, Shu [3 ]
机构
[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050044, Japan
[2] Japan Atom Energy Res Inst, Toukai, Ibaraki 3191195, Japan
[3] Univ Tokyo, Bunkyo Ku, Tokyo 1138656, Japan
关键词
Oxygen-ionic conductor; Oxyapatite; Neutron powder diffraction; Rietveld method; Low temperature; IONIC-CONDUCTIVITY; PHASES; LN=LA; GD; SM; DY; ND;
D O I
10.1016/j.nima.2008.11.081
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The neutron powder-diffraction data of the apatite-type La-silicate La9.50Si6O26.25, was measured using JAEA-HRPD diffractometer at 10K. The Rietveld refinement on the basis of hexagonal P6(3)/m was successfully carried out with anisotropic thermal displacement parameters for all sites. The obtained cell parameters were a=0.971297(7)nm, and c=0.717950(6)nm. On the Rietveld refinement supported by maximum entropy method, the interstitial oxygen positions show randomly distribution around La2 site, and they may give the driving-force of high ionic conductivity to the main ionic conduction site O4. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:319 / 321
页数:3
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