Fast computation of the kurtogram for the detection of transient faults

被引：1209

作者：

Antoni, Jerome ^{[1
]}

机构：

[1] Univ Technol Compiegne, Ctr Rech Royallieu, F-60205 Compiegne, France

来源：

MECHANICAL SYSTEMS AND SIGNAL PROCESSING | 2007年 / 21卷 / 01期

关键词：

kurtogram; spectral kurtosis; transient detection; vibration surveillance and diagnostics; time frequency; wavelet analysis;

D O I：

10.1016/j.ymssp.2005.12.002

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

The kurtogram is a fourth-order spectral analysis toot recently introduced for detecting and characterising nonstationarities in a signal. The paradigm relies on the assertion that each type of transient is associated with an optimal (frequency/frequency resolution) dyad {f,Delta f} which maximises its kurtosis, and hence its detection. However, the complete exploration of the whole plane (f, Delta f) is a formidable task hardly amenable to on-line industrial applications. In this communication we describe a fast algorithm for computing the kurtograin over a grid that finely samples the (f, Delta f) plane. Its complexity is on the order of N log N, similarly to the FFT. The efficiency of the algorithm is then illustrated on several industrial cases concerned with the detection of incipient transient faults. (c) 2006 Elsevier Ltd. All rights reserved.

引用

页码：108 / 124

页数：17

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