Angle resolved X-ray photoelectron spectroscopy study of Au deposited on Pt and Re surfaces

被引:29
作者
Bastl, Z [1 ]
Pick, S [1 ]
机构
[1] Acad Sci Czech Republic, J Heyrovsky Inst Phys Chem & Electrochem, CR-18223 Prague, Czech Republic
关键词
photoelectron spectroscopy; metal-metal interfaces; metallic films; gold; platinum; rheniurn;
D O I
10.1016/j.susc.2004.06.017
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The growth of Au on Pt and Re sputtered and annealed surfaces was investigated by angle resolved XPS method. The shifts of Au4f core electron binding energy were negative for Au deposited on Pt and higher in magnitude than positive shifts observed for Au on Re. The shifts did not depend on the structure of the Pt substrate surface but were affected by structure of the Re surface. More than 5 equivalent monolayers of Au on Pt were required to obtain bulk-like spectra while 2 monolayers were sufficient for Au/Re. The results suggested formation of several monolayers thick interface Au-Pt alloy in contrast to abrupt Au/Re interface. The measured trends in Au4f core level shifts were reproduced by those calculated using local density functional method within the initial state approximation. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:832 / 836
页数:5
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