Method of characterizing rubbed polyimide film for liquid crystal display devices using reflection ellipsometry

被引：55

作者：

Hirosawa, I

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 11期

关键词：

liquid crystal; molecular orientation; polyimide; rubbing; ellipsometry;

D O I：

10.1143/JJAP.35.5873

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Reflection ellipsometry is applied to characterize the molecular orientation of rubbed polyimide films for liquid crystal display devices. Thickness, dielectric constants and tilt angle of the principal dielectric axis of the molecularly oriented upper layer and thickness of the random layer in rubbed polyimide films can be determined by analyzing the anisotropic polarization of reflected light.

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页码：5873 / 5875

页数：3

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