The availability of inspected systems subject to shocks and graceful degradation

被引:101
作者
Klutke, GA [1 ]
Yang, YJ
机构
[1] Texas A&M Univ, Dept Ind Engn, College Stn, TX 77843 USA
[2] Samsung Elect, SCM Grp Command Ctr, Hwasung, Kyunggi Do, South Korea
基金
美国国家科学基金会;
关键词
graceful degradation; limiting average availability; non self-announcing failures; regenerative process; shock degradation;
D O I
10.1109/TR.2002.802891
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper studies maintained systems with non self-announcing ("hidden") failures that deteriorate due to both shocks and graceful degradation. Shocks occur according to a Poisson process, shock magnitudes are i.i.d. random variables, and between shocks, deterioration occurs at a constant rate. Inspections are performed periodically. Using regenerative arguments, an expression is derived for limiting average availability. This expression provides insight into the effect of system life distribution on availability, and suggests opportunities for more effective inspection strategies.
引用
收藏
页码:371 / 374
页数:4
相关论文
共 17 条
[1]  
Abdel-Hameed M. S., 1973, STOCHASTIC PROCESSES, V1, P383
[2]   OPTIMAL REPLACEMENT OF DAMAGED DEVICES [J].
ABDELHAMEED, M ;
SHIMI, IN .
JOURNAL OF APPLIED PROBABILITY, 1978, 15 (01) :153-161
[3]  
ASH R, 1972, REAL ANAL PROBABILIT, P101
[4]   An approach for computing tight numerical bounds on renewal functions [J].
Ayhan, H ;
Limón-Robles, J ;
Wortman, MA .
IEEE TRANSACTIONS ON RELIABILITY, 1999, 48 (02) :182-188
[5]   OPTIMUM CHECKING PROCEDURES [J].
BARLOW, RE ;
HUNTER, LC ;
PROSCHAN, F .
JOURNAL OF THE SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, 1963, 11 (04) :1078-1095
[6]  
Barlow RE, 1975, STAT THEORY RELIABIL
[7]   SHOCK MODELS AND WEAR PROCESSES [J].
ESARY, JD ;
MARSHALL, AW ;
PROSCHAN, F .
ANNALS OF PROBABILITY, 1973, 1 (04) :627-649
[8]  
KIJIMA M, 1991, NAV RES LOG, V38, P145, DOI 10.1002/1520-6750(199104)38:2<145::AID-NAV3220380203>3.0.CO
[9]  
2-D
[10]   The availability of inspected systems subject to random deterioration [J].
Klutke, GA ;
Wortman, MA ;
Ayhan, H .
PROBABILITY IN THE ENGINEERING AND INFORMATIONAL SCIENCES, 1996, 10 (01) :109-118