The new Chalk River AMS ion source, sample changer and external sample magazine

被引:6
作者
Koslowsky, VT
Bray, N
Imahori, Y
Andrews, HR
Davies, WG
机构
[1] AECL, Chalk River Laboratories, Chalk River
关键词
D O I
10.1016/S0168-583X(96)00628-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new sample magazine, sample changer and ion source have been developed and are in routine use at Chalk River. The system features a readily accessible 40-sample magazine at ground potential that is external to the ion source and high-voltage cage. The samples are held in an inert atmosphere and can be individually examined or removed; they can be exchanged en masse as a complete magazine concurrent with an AMS measurement. On-line sample changing is done with a pneumatic rabbit transfer system employing two stages of differential pumping. At Chalk River this is routinely performed across a 200 kV potential. Sample positioning is precise, and hundreds of Cl-36 and I-129 samples have been measured over a period of several days without interruption or alteration of ion source operating conditions.
引用
收藏
页码:203 / 207
页数:5
相关论文
共 1 条
[1]   The reduction of sample memory effects in the Chalk River AMS ion source [J].
Koslowsky, VT ;
Andrews, HR ;
Davies, WG ;
Imahori, Y ;
Bolusmjak, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 123 (1-4) :226-229