A methodology development for the study of near surface stress gradients

被引:21
作者
Marques, MJ
Dias, AM
Gergaud, P
Lebrun, JL
机构
[1] Univ Coimbra, Dept Mech Engn, GTR, P-3030 Coimbra, Portugal
[2] Univ Aix Marseille 3, CNRS, Fac Sci St Jerome, ESA 6088,MATOP, F-13397 Marseille 20, France
[3] ENSAM, CNRS, ESA 8006, LM3, F-75013 Paris, France
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2000年 / 287卷 / 01期
关键词
grazing incidence X-ray diffraction; residual stress gradients; PVD chromium film;
D O I
10.1016/S0921-5093(00)00819-4
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A modification of the geometry used in the sin(2) psi technique of X-ray diffraction is described. A modified equation for residual stress determination, including geometric adapted F-ij, is presented. This method allows near surface stress gradients determination and is called pseudo-grazing incidence method. The limits of the new technique were first tested on different powder materials with X-ray radiation produced by conventional tubes and by a synchrotron radiation source. The technique was finally applied for the determination of a residual stress profile in a polished molybdenum surface before and after the deposition of a PVD chromium film. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:78 / 86
页数:9
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