共 5 条
[1]
FRENZ BA, 1978, COMPUTING CRYSTALLOG, P64
[3]
SHELDRICK GM, 1993, SHELX93 SYSTEM COMPU
[4]
VASILIEVA OU, 1993, UKR KHIM ZH, V59, P176
[5]
AN EMPIRICAL-METHOD FOR CORRECTING DIFFRACTOMETER DATA FOR ABSORPTION EFFECTS
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1983, 39 (JAN)
:158-166