Theoretical study of an absorbing sample in infrared near-field spectromicroscopy

被引:8
作者
Dazzi, A
Goumri-Said, S
Salomon, L
机构
[1] Ctr Univ Paris Sud, Lab Utilisat Rayonnement Electromagnet, F-91898 Orsay, France
[2] Univ Bourgogne, Fac Sci Mirande, Lab Phys, CNRS,UMR 5027, F-21078 Dijon, France
关键词
optical near-field; spectromicroscopy; diffraction effects;
D O I
10.1016/j.optcom.2004.02.084
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper is devoted to study the near-field spectrometry in the infrared spectral range. To understand the behavior of the infrared light diffracted by an object, numerical calculations have been carried out with Fourier Modale (FM) method within R-matrix algorithm. We consider the case of three-dimensional system including a translational symmetry in one direction, where is included an homogenous layer in which is buried an absorbing object. Using an optical near-field analysis and by calculating the electric field intensity distribution, both of the thickness effect and the lateral size of the absorbing sample are investigated. It is found that the distribution of the intensity related to the electric field is depending on geometry of the absorbing object. Also, we show how the diffraction due to the sample edges has an effect on the field intensity distribution. After that we pay more attention to the spectroscopy mapping description, in particular to the influence of the sample characteristics on detection of an absorbent object in near-field. This technique is also able to detect the doublet of an absorbent object with over-wavelength size but in near-field zone. When the lateral size of the object is a sub-wavelength, the absorption bands are detected with slight distortion but the diffraction effects are present. To diminish the diffraction effects, we reduce the sample thickness which may induce a more important absorption bands distortion. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:351 / 360
页数:10
相关论文
共 22 条
[1]   Direct reconstruction of surfaces from near-field intensity under spatially incoherent illumination [J].
Carminati, R ;
Greffet, JJ ;
Garcia, N ;
NietoVesperinas, M .
OPTICS LETTERS, 1996, 21 (07) :501-503
[2]   INFLUENCE OF DIELECTRIC CONTRAST AND TOPOGRAPHY ON THE NEAR-FIELD SCATTERED BY AN INHOMOGENEOUS SURFACE [J].
CARMINATI, R ;
GREFFET, JJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (12) :2716-2725
[3]  
Carr G. L., 1996, AIP C P, P418
[4]  
Carr GL, 1997, P SOC PHOTO-OPT INS, V3153, P51, DOI 10.1117/12.290262
[5]   A DARK-FIELD PHOTON SCANNING TUNNELING MICROSCOPE UNDER INCOHERENT-LIGHT ILLUMINATION [J].
CHABRIER, G ;
DEFORNEL, F ;
BOURILLOT, E ;
SALOMON, L ;
GOUDONNET, JP .
OPTICS COMMUNICATIONS, 1994, 107 (5-6) :347-352
[6]   Analysis of image formation with a photon scanning tunneling microscope [J].
deFornel, F ;
Adam, PM ;
Salomon, L ;
Goudonnet, JP ;
Sentenac, A ;
Carminati, R ;
Greffet, JJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (01) :35-45
[7]   RESOLUTION OF THE PHOTON SCANNING TUNNELING MICROSCOPE - INFLUENCE OF PHYSICAL PARAMETERS [J].
DEFORNEL, F ;
SALOMON, L ;
ADAM, P ;
BOURILLOT, E ;
GOUDONNET, JP ;
NEVIERE, M .
ULTRAMICROSCOPY, 1992, 42 :422-429
[8]   Enhancing the lateral resolution in infrared microspectrometry by using synchrotron radiation: applications and perspectives [J].
Dumas, P ;
Carr, GL ;
Williams, GP .
ANALUSIS, 2000, 28 (01) :68-74
[9]   Image formation in near-field optics [J].
Greffet, JJ ;
Carminati, R .
PROGRESS IN SURFACE SCIENCE, 1997, 56 (03) :133-237
[10]   Infrared near-field study of a localised absorption in a thin film [J].
Gross, N ;
Dazzi, A ;
Ortega, JM ;
Andouart, R ;
Prazeres, R ;
Chicanne, C ;
Goudonnet, JP ;
Lacroute, Y ;
Boussard, C ;
Fonteneau, G ;
Hocdé, S .
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2001, 16 (02) :91-98