A connection between uniformity and aberration in regular fractions of two-level factorials

被引：105

作者：

Fang, KT ^{[1
]}

Mukerjee, R

机构：

[1] Hong Kong Baptist Univ, Dept Math, Hong Kong, Hong Kong, Peoples R China

[2] Indian Inst Management, Calcutta 700027, W Bengal, India

来源：

BIOMETRIKA | 2000年 / 87卷 / 01期

关键词：

centred L-2-discrepancy; fractional factorial design; minimum aberration; uniformity; wordlength pattern;

D O I：

10.1093/biomet/87.1.193

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

We show a link between the two apparently unrelated areas of uniformity and minimum aberration. With reference to regular fractions of two-level factorials, we derive an expression for the centred L-2-discrepancy measure for uniformity in terms of the word-length pattern. This result indicates, in particular; excellent behaviour of minimum aberration designs with regard to uniformity and provides further justification for the popular criterion of minimum aberration.

引用

页码：193 / 198

页数：6