Photoelectron diffraction imaging for C2H2 and C2H4 chemisorbed on Si(100) reveals a new bonding configuration

被引：75

作者：

Xu, SH ^{[1
]}

Keeffe, M

Yang, Y

Chen, C

Yu, M

Lapeyre, GJ

Rotenberg, E

Denlinger, J

Yates, JT

机构：

[1] Montana State Univ, Dept Phys, Bozeman, MT 59717 USA

[2] LBNL, Adv Light Source, Berkeley, CA 94720 USA

[3] Univ Pittsburgh, Ctr Surface Sci, Dept Chem, Pittsburgh, PA 15260 USA

[4] Univ Pittsburgh, Ctr Surface Sci, Dept Phys, Pittsburgh, PA 15260 USA

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 84卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.84.939

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new adsorption site for adsorbed acetylene on Si(100) is observed by photoelectron imaging based on the holographic principle. The diffraction effects in the carbon Is angle-resolved photoemission are inverted (including the small-cone method) to obtain an image of the atom's neighboring carbon. The chemisorbed acetylene molecule is bonded to four silicon surface atoms. In contrast to the C2H2 case, the image for adsorbed C2H4 shows it bonded to two Si surface atoms.

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页码：939 / 942

页数：4

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