Impedance differences found with n-alkanethiol monolayers prepared by contact printing and solution adsorption

被引:3
作者
Adamczyk, Leslie A. [2 ]
Anderson, Mark R. [1 ]
机构
[1] Univ Colorado, Dept Chem, Denver, CO 80217 USA
[2] Virginia Polytech Inst & State Univ, Dept Chem, Blacksburg, VA 24060 USA
关键词
Self-assembled monolayer; Defects; Contact printing; SELF-ASSEMBLED MONOLAYERS; THIOL MONOLAYERS; STRUCTURAL-CHARACTERIZATION; MOLECULAR MONOLAYERS; CYCLIC VOLTAMMETRY; GOLD ELECTRODES; CHARGE-TRANSFER; DEFECTS; SPECTROSCOPY; AU(111);
D O I
10.1016/j.jcis.2009.04.051
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Self-assembled monolayers (SAMS) of n-octadecanethiol, n-doclecanethiol and n-pentanethiol formed by contact printing and Solution adsorption are characterized by electrochemical impedance spectroscopy (EIS). Impedance measurements show that monolayers prepared by contact printing are on the order of 5 times less resistive to charge transfer and have greater defect density than monolayers prepared by Solution adsorption. Modeling of the average defect size and density show that the size of monolayer defects stays relatively constant independent of the monolayer preparation conditions; however, the density of defects decreases with increasing concentration for, the contact printed monolayers. The impedance data also show that monolayers prepared by Solution adsorption have fewer defects than those prepared by contact printing. (C) 2009 Elsevier Inc. All rights reserved.
引用
收藏
页码:761 / 765
页数:5
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