Principal component analysis of TOF-SIMS images of organic monolayers

被引:84
作者
Biesinger, MC [1 ]
Paepegaey, PY [1 ]
McIntyre, NS [1 ]
Harbottle, RR [1 ]
Petersent, NO [1 ]
机构
[1] Univ Western Ontario, Dept Chem, London, ON N6A 5B7, Canada
关键词
D O I
10.1021/ac020311n
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Principal component analysis (PCA) is a statistical method used to find combinations of variables or factors that describe the most important trends in the data. PCA has been combined with time-of-flight secondary ion mass spectrometry (TOF-SIMS) data to extract new information and find relations between species contained in complex systems. Monolayers of dipalmitoylphosphatidylcholine alone and mixed with palmitoyloleoylphosphatidylglycerol prepared using the Langmuir- Blodgett technique are discussed. PCA software provides image scores and corresponding loadings for each significant principal component. Image plots of the scores show the spatial distribution and intensity of the species defined by the loading plots (mass spectral features). The intensity and resolution of the image scores can result in substantial improvement over that of the regular TOF-SIMS images especially when static conditions are used for small analysis areas. Also, some of the effects of topography and matrix in the images can be removed, allowing for a better presentation of chemical variations.
引用
收藏
页码:5711 / 5716
页数:6
相关论文
共 15 条
[1]   POLYMORPHISM OF PHOSPHOLIPID MONOLAYERS [J].
ALBRECHT, O ;
GRULER, H ;
SACKMANN, E .
JOURNAL DE PHYSIQUE, 1978, 39 (03) :301-313
[2]  
Benninghoven A., 1987, SECONDARY ION MASS S
[3]   Imaging of domain structures in a one-component lipid monolayer by time-of-flight secondary ion mass spectrometry [J].
Bourdos, N ;
Kollmer, F ;
Benninghoven, A ;
Sieber, M ;
Galla, HJ .
LANGMUIR, 2000, 16 (04) :1481-1484
[4]   Solution assembled and microcontact printed monolayers of dodecanethiol on gold: A multivariate exploration of chemistry and contamination [J].
Graham, DJ ;
Price, DD ;
Ratner, BD .
LANGMUIR, 2002, 18 (05) :1518-1527
[5]  
Hagenhoff B, 1998, HANDBOOK OF SURFACE AND INTERFACE ANALYSIS, P209
[6]   ION INTENSITY AND IMAGE-RESOLUTION IN SECONDARY ION MASS-SPECTROMETRY [J].
KARGACIN, ME ;
KOWALSKI, BR .
ANALYTICAL CHEMISTRY, 1986, 58 (11) :2300-2306
[7]  
LANG F, 2000, SIMS, V12, P813
[8]  
Lhoest JB, 2001, J BIOMED MATER RES, V57, P432, DOI 10.1002/1097-4636(20011205)57:3<432::AID-JBM1186>3.0.CO
[9]  
2-G
[10]  
LLOYD KG, 1998, SIMS, V11, P555