Contouring of artwork surface by fringe projection and FFT analysis

被引:56
作者
Spagnolo, GS
Guattari, G
Sapia, C
Ambrosini, D
Paoletti, D
Accardo, G
机构
[1] Univ Studi Roma Tre, INFM, Dipartimento Ingn Elettron, I-00146 Rome, Italy
[2] Univ Aquila, INFM, Dipartimento Energet, I-67040 Laquila, Italy
[3] ICR, Fis Lab, I-00153 Rome, Italy
关键词
projection grating; phase map; shape measurement; Fourier transform;
D O I
10.1016/S0143-8166(00)00023-3
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In the present work, we propose a simple optical method to perform profilometry on works of art. The method is based on the projection of a Ronchi grating onto the surface to be analyzed. When viewed at an angle different from the projection angle, the grid pattern appears deformed by the surface shape. This pattern is digitized, by a high-resolution CCD camera, and then processed using a Fourier transform analysis. The technique is free from the errors caused by higher harmonic components of the grating pattern. Furthermore, the method relies on very simple equipment and it is therefore suitable for in situ measurements. Theoretical details and examples of the technique in operation are given. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
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页码:141 / 156
页数:16
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