Anchoring data quality dimensions in ontological foundations

被引：629

作者：

Wand, Y ^{[1
]}

Wang, RY ^{[1
]}

机构：

[1] MIT,ALFRED P SLOAN SCH MANAGEMENT,CAMBRIDGE,MA 02139

来源：

关键词：

D O I：

10.1145/240455.240479

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

[No abstract available]

引用

页码：86 / 95

页数：10

共 25 条

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