Defects of graphene on Ir(111): Rotational domains and ridges

被引：164

作者：

Loginova, Elena ^{[1
]}

Nie, Shu ^{[1
]}

Thuermer, Konrad ^{[1
]}

Bartelt, Norman C. ^{[1
]}

McCarty, Kevin F. ^{[1
]}

机构：

[1] Sandia Natl Labs, Livermore, CA 94550 USA

来源：

PHYSICAL REVIEW B | 2009年 / 80卷 / 08期

关键词：

electron microscopy; graphene; impurities; low energy electron diffraction; materials preparation; scanning tunnelling microscopy; MONOLAYER GRAPHITE; 111; SURFACE; CARBON; RU(0001); OVERLAYERS; PT(111); LEED; DECOMPOSITION; SPECTROSCOPY; MICROSCOPY;

D O I：

10.1103/PhysRevB.80.085430

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We use low-energy electron microscopy (LEEM), low-energy electron diffraction (LEED), and scanning tunneling microscopy (STM) to study different orientations of single-layer graphene sheets on Ir(111). The most-abundant orientation has previously been characterized in the literature. Using selective-area LEED we find three other variants, which are rotated 14 degrees, 18.5 degrees, and 30 degrees with respect to the most common variant. The similar to 30 degrees-rotated structure is also studied by STM. We propose that all four variants are moireacute structures that can be classified using simple geometric rules involving periodic and quasiperiodic structural motifs. In addition, LEEM reveals that linear defects form in the graphene sheets during cooling from the synthesis temperature. STM shows that these defects are ridges, suggesting that the graphene sheets delaminate locally as the Ir substrate contracts.

引用

页数：8

共 39 条

[1] Noncatalytic synthesis of carbon nanotubes, graphene and graphite on SiC [J].