Rietveld analysis using a laboratory-based high pressure x-ray diffraction system and film-based detection

Rietveld structure refinement using a laboratory-based high pressure x-ray diffraction system described previously and film-based detection is reported. Although there is currently much emphasis on the use of synchrotron radiation and advanced detectors such as imaging plates and position-sensitive detectors for collection of high pressure diffraction data suitable for Rietveld analysis, the results presented here demonstrate that excellent refinements can be performed on data collected at low cost in the laboratory with film-based detection. The diffraction system exhibits an instrumental profile suitable for Rietveld analysis, exhibiting no asymmetry and narrow linewidths. (C) 1997 American Institute of Physics.