Comparison of microwave and mutual inductance measurements of the inductive nonlinearity of HTS thin films

被引:7
作者
Claassen, JH [1 ]
Booth, JC
Beall, JA
Vale, LR
Rudman, DA
Ono, RH
机构
[1] USN, Res Lab, Washington, DC 20375 USA
[2] Natl Inst Stand & Technol, Boulder, CO 80303 USA
关键词
D O I
10.1088/0953-2048/12/11/307
中图分类号
O59 [应用物理学];
学科分类号
摘要
A quadratic dependence of penetration depth on supercurrent density may be observed both by an inductive measurement on unpatterned films and by a microwave measurement of third-harmonic generation in coplanar waveguide. Results for the two methods are compared for a series of YBCO films. We find good agreement between the two measurements.
引用
收藏
页码:714 / 716
页数:3
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