Rejection based classifier for face detection

被引:32
作者
Elad, M [1 ]
Hel-Or, Y [1 ]
Keshet, R [1 ]
机构
[1] Hewlett Packard Labs, IL-32000 Haifa, Israel
关键词
pattern detection; classification; maximal-rejection; face-detection; generalized eigenvalue;
D O I
10.1016/S0167-8655(02)00106-X
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Pattern detection problems require a separation between two classes, Target and Clutter, where the probability of the former is substantially smaller compared to that of the latter. In this paper we propose a new classifier that exploits this property, yielding a low complexity yet effective target detection algorithm. This algorithm, called the maximal rejection classifier (MRC), is based on linear successive rejection operations. An application of detecting faces in images is demonstrated using the MRC with encouraging results. (C) 2002 Published by Elsevier Science B.V.
引用
收藏
页码:1459 / 1471
页数:13
相关论文
共 20 条
[1]  
[Anonymous], IEEE C COMP VIS PATT
[2]  
BAKER S, 1995, CUCS01395
[3]  
BAKER S, 1996, P 1996 IEEE COMP SOC
[4]  
CORTES C, 1995, MACH LEARN, V20, P273, DOI 10.1023/A:1022627411411
[5]  
Demmel J.W., 1997, APPL NUMERICAL LINEA
[6]  
ELAD M, 1998, HPL98160
[7]  
ELAD M, 1999, HPL995
[8]  
Golub G.H., 2013, MATRIX COMPUTATIONS
[9]  
GOTSMAN C, 1996, HPL9683
[10]  
Hart P.E., 1973, Pattern recognition and scene analysis