Electron microscope calibration for the Lorentz mode

被引：8

作者：

Fazzini, PF

Merli, PG

Pozzi, G

机构：

[1] Univ Bologna, Dept Phys, I-40127 Bologna, Italy

[2] Univ Bologna, Ist Nazl Fis Mat, I-40127 Bologna, Italy

[3] CNR, Ist IMM, Sez Bologna, I-40129 Bologna, Italy

来源：

ULTRAMICROSCOPY | 2004年 / 99卷 / 2-3期

关键词：

electron microscopy; Lorentz microscopy; calibration; p-n junctions;

D O I：

10.1016/j.ultramic.2004.01.002

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The calibration of a modern electron microscope for Lorentz microscopy observations has been performed using diffractogram, Fresnel diffraction fringe analysis and low-angle electron diffraction methods. An example related to the observations of electrostatic fields associated to a thinned reverse-biased p-n junction is also reported. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：201 / 209

页数：9

共 18 条

[1]

[Anonymous], ADV OPTICAL ELECT MI

[2]

BARTY A, 2001, MAGNETIC IMAGING ITS, V36, P137

[3] Influence of charged oxide layers on TEM imaging of reverse-biased p-n junctions -: art. no. 045328 [J].