Quality control of GEM detectors using scintillation techniques

被引：10

作者：

Fraga, FAF ^{[1
]}

Fetal, STG

Marques, RF

Policarpo, AJPL

机构：

[1] Univ Coimbra, Dept Fis, LIP Coimbra, P-3004516 Coimbra, Portugal

[2] LIP, Lab Instrumentacao & Fis Expt Partuculas, P-3004516 Coimbra, Portugal

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2000年 / 442卷 / 1-3期

关键词：

GEM detectors; CCD; microstructures;

D O I：

10.1016/S0168-9002(99)01266-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Non-destructive quality control of microstructures at the manufacturing stage is an important issue in the foreseen use of huge numbers of such gaseous detectors in the future high luminosity colliders. In this work we report on the use of the scintillation light emitted by the avalanches in GEM channels for checking defects in the foils. The test system is described and data on the relative efficiency of several gaseous mixtures are presented. The foil images obtained with a low-noise CCD system are analysed and compared with the optical images obtained with an industrial inspection system of high magnification. The validity of this test method is established and possible extensions of its use are discussed. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：417 / 422

页数：6