Precision mass measurements using a penning trap and highly charged ions produced in an electron beam ion source

A method for precision mass measurements in a Penning trap using highly charged ions produced in an electron beam ion source (CRYSIS) has been developed. The cyclotron frequencies for O-8+,O- 7+,O- 6+,O- 5+ and Ar-18+,Ar- 17+,Ar- 16+,Ar- 15+,Ar- 14+,Ar- 13+ ions have been determined by the excitation of the sum frequency nu+ + nu-. In addition to CRYSIS ions, H+, H-2(+) and He+ ions were produced by electron bombardment of the Hz rest gas or helium gas introduced through an UHV leak valve into an auxiliary ion trap (or a pre-trap). A technique for fast (seconds) interchanging of the ion species in the precision trap has been implemented to reduce the long term magnetic field drift.