Variation of K X-ray fluorescence cross-sections of Ti, V and Cr in halogens compounds in energy interval 5.5-12.1 keV

被引：10

作者：

Baydas, E ^{[1
]}

Sögüt, Ö

Sahin, Y

Büyükkasap, E

机构：

[1] Ataturk Univ, Dept Phys, Fac Arts & Sci, TR-25240 Erzurum, Turkey

[2] Ataturk Univ, Dept Phys, Fac Educ, TR-25240 Erzurum, Turkey

来源：

JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER | 2002年 / 75卷 / 04期

关键词：

D O I：

10.1016/S0022-4073(02)00024-9

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The photon-induced K X-ray fluorescence cross-sections (sigma(Kalpha), sigma(Kbeta)) for Ti, V and Cr in halogens (F and Cl) compounds were investigated. Measurements were carried out at 10 different energies in the interval 5.5-12.1 keV by using secondary excitation method. K X-rays emitted by samples were counted by a Si(Li) detector with resolution 160 eV at 5.9 keV. Obtained values were compared with the theoretical values of pure elements. (C) 2002 Elsevier Science Ltd. All rights reserved.

引用

页码：473 / 480

页数：8

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