Optical properties of solution-chemically derived thin film Ni-Al2O3 composites and Si, Al and Si-Ti oxides

被引：12

作者：

Bostrom, Tobias K. ^{[1
]}

Wackelgard, Ewa ^{[1
]}

机构：

[1] Uppsala Univ, Dept Engn Sci, Div Solid State Phys, SE-75121 Uppsala, Sweden

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2006年 / 18卷 / 32期

关键词：

D O I：

10.1088/0953-8984/18/32/021

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 [凝聚态物理];

摘要：

The refractive index in the wavelength range 350-2500 nm of solar absorbing and anti-reflecting thin films was determined from reflectance and transmittance measurements. Knowing the refractive indices of such films was important when designing an optimized spectrally selective surface for solar thermal usage. The absorbing thin films were made of nickel-alumina composites with a nickel content varying from 20 to 80%. The anti-reflecting films were made of silica, hybrid-silica, alumina and silica-titania composites.

引用

页码：7737 / 7750

页数：14

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