Reduction of the number of electrons emitted backwards in back-gated devices for field emission: A theoretical study

被引:3
作者
Mammana, VP
Fonseca, LRC
机构
[1] Int Technol Ctr, Raleigh, NC 27617 USA
[2] Motorola Inc, Semicond Prod Sector, BR-13820000 Jaguariuna, SP, Brazil
关键词
D O I
10.1063/1.1776612
中图分类号
O59 [应用物理学];
学科分类号
摘要
The use of back-gated geometry (BGG) for field emission devices promises improved robustness, lower power consumption, and simpler manufacturing process. The BGG is a configuration in which the cathode is positioned between anode and gate, different from conventional approaches. Using a cylinder/plane model to represent rows of cathode lines and the back-gate it is demonstrated that this geometry combined with an appropriate effective work-function modulation along the cathode surface can reduce the amount of electrons emitted backwards. (C) 2004 American Institute of Physics.
引用
收藏
页码:834 / 836
页数:3
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