Design and performance of a beetle-type double-tip scanning tunneling microscope

被引：25

作者：

Jaschinsky, Philipp

Coenen, Peter

Pirug, Gerhard

Voigtlander, Bert

机构：

[1] Forschungszentrum Julich, Inst Bio & Nanosyst 3, D-52425 Julich, Germany

[2] Forschungszentrum Julich, Ctr Nanosyst Informat Technol, CNI, D-52425 Julich, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2006年 / 77卷 / 09期

关键词：

CONDUCTIVITY MEASUREMENTS; STABILITY;

D O I：

10.1063/1.2336112

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A combination of a double-tip scanning tunneling microscope with a scanning electron microscope in ultrahigh vacuum environment is presented. The compact beetle-type design made it possible to integrate two independently driven scanning tunneling microscopes in a small space. Moreover, an additional level for coarse movement allows the decoupling of the translation and approach of the tunneling tip. The position of the two tips can be controlled from the millimeter scale down to 50 nm with the help of an add-on electron microscope. The instrument is capable of atomic resolution imaging with each tip. (c) 2006 American Institute of Physics.

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页数：5

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