Measurement of fast frequency fluctuations: Allan variance of a grating-stabilized diode laser

被引:13
作者
Kunze, S [1 ]
Wolf, S [1 ]
Rempe, G [1 ]
机构
[1] UNIV KONSTANZ,FAK PHYS,D-78434 CONSTANCE,GERMANY
关键词
D O I
10.1016/0030-4018(96)00097-1
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Fast frequency fluctuations of a 780 nm grating-stabilized diode laser are directly observed by the measurement of the Allan variance. Time intervals as short as 10 ns and up to 1 a are realized by means of two independent time interval counters. Frequency fluctuations with the laser locked ro a Doppler-free resonance transition of atomic rubidium are examined in detail.
引用
收藏
页码:269 / 274
页数:6
相关论文
共 8 条
[1]   STATISTICS OF ATOMIC FREQUENCY STANDARDS [J].
ALLAN, DW .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02) :221-&
[2]   FREQUENCY-MODULATION (FM) SPECTROSCOPY - THEORY OF LINESHAPES AND SIGNAL-TO-NOISE ANALYSIS [J].
BJORKLUND, GC ;
LEVENSON, MD ;
LENTH, W ;
ORTIZ, C .
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1983, 32 (03) :145-152
[3]   LASER PHASE AND FREQUENCY STABILIZATION USING AN OPTICAL-RESONATOR [J].
DREVER, RWP ;
HALL, JL ;
KOWALSKI, FV ;
HOUGH, J ;
FORD, GM ;
MUNLEY, AJ ;
WARD, H .
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1983, 31 (02) :97-105
[4]   A COMPACT GRATING-STABILIZED DIODE-LASER SYSTEM FOR ATOMIC PHYSICS [J].
RICCI, L ;
WEIDEMULLER, M ;
ESSLINGER, T ;
HEMMERICH, A ;
ZIMMERMANN, C ;
VULETIC, V ;
KONIG, W ;
HANSCH, TW .
OPTICS COMMUNICATIONS, 1995, 117 (5-6) :541-549
[5]   CHARACTERIZATION OF FREQUENCY STABILITY IN PRECISION FREQUENCY SOURCES [J].
RUTMAN, J ;
WALLS, FL .
PROCEEDINGS OF THE IEEE, 1991, 79 (07) :952-960
[6]  
VANIER J, 1989, QUANTUM PHYSICS ATOM
[7]   USING DIODE-LASERS FOR ATOMIC PHYSICS [J].
WIEMAN, CE ;
HOLLBERG, L .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (01) :1-20
[8]   STABILIZATION OF OPTICAL-PHASE FREQUENCY OF A LASER SYSTEM - APPLICATION TO A COMMERCIAL DYE-LASER WITH AN EXTERNAL STABILIZER [J].
ZHU, M ;
HALL, JL .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1993, 10 (05) :802-816