Determination of the anisotropic dielectric function for metal free phthalocyanine thin films

被引:30
作者
Gordan, OD [1 ]
Friedrich, M [1 ]
Zahn, DRT [1 ]
机构
[1] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany
关键词
ellipsometry; infrared spectroscopy; optical anisotropy; organic molecular thin films;
D O I
10.1016/j.tsf.2003.11.209
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of metal free phthalocyanine (H,Pc) were grown by organic molecular beam deposition (OMBD) in high vacuum (HV) simultaneously on different substrates. The substrates (hydrogen passivated Si(111) and NaCl) were kept at room temperature during the deposition. From the absorption spectra in the visible and ultraviolet region the films are found to consist predominantly of the a crystalline phase. All the films are uniaxial and strongly optically anisotropic. The dielectric function for H,Pc films was obtained in the spectral range of 0.7-4.5 eV from the simulation of ellipsometry spectra. The orientation of the molecules with respect to the substrate is derived from the difference between the in-plane and out-of-plane components of the dielectric function and the results of infrared (IR) measurements. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:551 / 556
页数:6
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