Approach for the evaluation of speckle deformation measurements by application of the wavelet transformation

被引：13

作者：

Berger, E ^{[1
]}

vonderLinden, W ^{[1
]}

Dose, V ^{[1
]}

Ruprecht, MW ^{[1
]}

Koch, AW ^{[1
]}

机构：

[1] UNIV SAARLAND,LEHRSTUHL MESSTECH,D-66041 SAARBRUCKEN,GERMANY

来源：

APPLIED OPTICS | 1997年 / 36卷 / 29期

关键词：

speckle interferometry; fringe evaluation; wavelet transformation; probability theory;

D O I：

10.1364/AO.36.007455

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We introduce a new, to our knowledge, method using wavelets and probability theory for the evaluation of speckle interference patterns for quantitative out-of-plane deformation measurements of rough surfaces of nontransparent solids. The experiment uses a conventional Twyman-Green interferometer setup. The speckle interference patterns are obtained by the common method of subtraction of images taken before and after a surface deformation. The data are processed by a wavelet transformation, which analyzes the image structures on different length scales. Thus it is possible to separate the interference fringes from the noise. From the locations of the interference fringes, the deformation of the surface can be reconstructed by means of probability theory. (C) 1997 Optical Society of America.

引用

页码：7455 / 7460

页数：6

共 17 条

[1]

[Anonymous], 1993, Ten Lectures of Wavelets

[2]

Creath K, 1988, PROG OPTICS, V26, P350

[3]

Dainty J. C., 1989, LASER SPECKLE RELATE

[4] DIGITAL PROCESSING OF ELECTRONIC SPECKLE PATTERN INTERFEROMETRY ADDITION FRINGES [J].

DAVILA, A ;

KERR, D ;

KAUFMANN, GH .

APPLIED OPTICS, 1994, 33 (25) :5964-5969

[5]

Francon M., 1979, LASER SPECKLE APPL O

[6]

FROMENT J, 1992, WAVELETS TUTORIAL TH, P655

[7]

JAYNES ET, 1983, ET JAYNES PAPERS PRO, P337

[8]

JAYNES ET, 1983, ET JAYNES PAPERS PRO, P114

[9]

Jones R., 1989, HOLOGRAPHIC SPECKLE, DOI DOI 10.1017/CBO9780511622465

[10]

Kaiser G., 1994, A Friendly Guide to Wavelets

← 1 2 →