Sub-μrad angular stability measurements by use of Long-Trace-Profiler-based systems

被引:5
作者
Qian, SN [1 ]
Takacs, P [1 ]
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
来源
X-RAY OPTICS DESIGN, PERFORMANCE, AND APPLICATIONS | 1999年 / 3773卷
关键词
anglular stability; sub-mu rad; precise measurement; long trace profiler; LTP; temperature stability;
D O I
10.1117/12.370088
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High accuracy angle measurement at the sub-mu rad level requires extremely high instrument stability. in order to reach sub-mu rad stability (0.1 are second or less) over long time periods, it is necessary to maintain the test object and almost all of the optical components in the measuring instrument in very steady positions. However, mechanical force relaxation, thermal expansion, and asymmetric structures produce angular and Linear displacements in the system, resulting in angular measurement error. A Long-Trace-Profiler (LTP)-based stable equipment is used to test precision angular stability with sub-mu rad resolution. Long term stability over 15 hours has been measured on different kind of mechanical structures. Temperature monitoring during the tests is extremely important. Some test results showing the effects of thermal variations are presented, which indicate that temperature stability on the older of 0.1 degrees C is absolutely necessary for repeatable sub-mu rad measurements. The optical method, using optics with an even number of reflecting surfaces (for example, a right angle prism, pentaprism, or rhomboid prism) to reduce the influence of existing angular displacement, is introduced and the comparison measurement is presented. An optical fiber transfer line is able to reduce the laser angular shift from about 10 mu rad to a level of 0.3 mu rad rms. Careful system configuration, design and operation are very important for the sub-mu rad angle stability.
引用
收藏
页码:158 / 166
页数:9
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