Patent citations as a measure of knowledge flows:: The influence of examiner citations

被引:482
作者
Alcacer, Juan [1 ]
Gittelman, Michelle [1 ]
机构
[1] NYU, Stern Sch Business, New York, NY USA
关键词
D O I
10.1162/rest.88.4.774
中图分类号
F [经济];
学科分类号
02 ;
摘要
Analysis of patent citations is a core methodology-in the study of knowledge diffusion. However, citations made by patent examiners have not been separately reported, adding unknown noise to the data. We leverage a recent change in the reporting of patent data showing citations added by examiners. The magnitude is high: two-thirds of citations on the average patent are inserted by examiners. Furthermore, 40% of all patents have all citations added by examiners. We analyze the distribution of examiner and inventor citations with respect to self-citation, distance, technology overlap, and vintage. Results indicate that inferences about inventor knowledge using pooled citations may suffer from bias or overinflated significance levels.
引用
收藏
页码:774 / 779
页数:6
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