Reflection grating photogrammetry for the measurement of specular surfaces

被引：10

作者：

Petz, M ^{[1
]}

Tutsch, R ^{[1
]}

机构：

[1] Tech Univ Braunschweig, Inst Produktionsmesstechnik, D-38106 Braunschweig, Germany

来源：

TECHNISCHES MESSEN | 2004年 / 71卷 / 7-8期

关键词：

specular surfaces; reflection grating method; photogrammetry; deflectometry;

D O I：

10.1524/teme.71.7.389.36694

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The contactless three-dimensional measurement of specular reflecting freeform surfaces causes considerable difficulties, despite recent advances in the testing of aspheres. The geometric optical measurement techniques presented in this paper are based on the reflection grating method. In conjunction with photogrammetric evaluation techniques, they allow the pointwise and unambiguous registration of almost arbitrarily shaped specular surfaces.

引用

页码：389 / 397

页数：9

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