Statistical analysis of analog structures through variance calculation

被引：22

作者：

Graupner, A ^{[1
]}

Schwarz, W ^{[1
]}

Schüffny, R ^{[1
]}

机构：

[1] Tech Univ Dresden, Dept Elect Engn & Informat Technol, D-01062 Dresden, Germany

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 2002年 / 49卷 / 08期

关键词：

sensitivity; statistical analysis; tolerance analysis; variance calculation;

D O I：

10.1109/TCSI.2002.801260

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Variance analysis is used for the estimation of how random device parameter variation effects the behavior of analog integrated circuits. This method is very effective if the random parameter deviations can be assumed to be normally distributed and statistically independent and if the nonlinear dependence of the circuit characteristics can be linearized around the nominal (mean) parameter values. It is shown under which conditions the nonlinear dependencies of the system characteristics on the parameters have to be taken into account and how this can improve the accuracy of statistical analysis. This is illustrated with two examples: a transconductance amplifier and an analog filter.

引用

页码：1071 / 1078

页数：8

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