Deuterium retention and re-emission from tungsten materials

Deuterium retention in five types of tungsten samples (W single crystal, W produced by hot pressing, chemical vapor and plasma sprayed deposited W coatings) has been investigated during and after implantation with 1.5 keV D-ions at 300, 600, and 900 K by means of re-emission, thermal desorption spectroscopy and nuclear reaction analysis measurements. Deuterium inventory and its spontaneous and thermal release depend strongly on the structure of the material. At 300 K, the saturated amount of D retained in the samples is in the range 1 x 10(17) to 4 x 10(17) D/cm(2). For higher implantation temperature, 900 K, the retained amount is smaller by a factor of about 50 than for 300 K. During implantation D is retained far beyond the implantation zone. An amount of similar or equal to 3 x 10(16) D/cm(2) is trapped in the near-surface layer during implantation at 300 K. More than 50% of the implanted D diffuses into the bulk and is captured by lattice imperfections.